Filter by：

• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

182 nm Standard Step Height

Girds Matrix

Roughness Standard Sample

Laser Marked Sample

Metal Groove

Polished Silicon Wafer

f approximately 1.7 mm and a depth of approximately 1 mm. It can provide a basis for analyzing the degree of mechanical damage on the material surface, evaluating the wear resistance of the material, and improving surface processing and treatment processes.

">

Metal Scratch