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atomic step with a scanning range of 500 nm, and the step height is approximately 0.75 nm. SiC, as a representative material of wide bandgap semiconductors, is regarded as an ideal material for manufacturing high-power semiconductor devices.

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SiC Atomic Step
SiC Atomic Step
  • Patterned Sapphire Substrate (PSS)
    Patterned Sapphire Substrate (PSS)
  • CMP Micro-Holes Array
    CMP Micro-Holes Array
  • OLED Pattern
    OLED Pattern
  • ETL Structure
    ETL Structure
  • PLZT
    PLZT
  • SiC Surface
    SiC Surface
  • The Edge Structure of PSS
    The Edge Structure of PSS
  • The Surface Potential of SRAM
    The Surface Potential of SRAM
  • Standard Wafer
    Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • The Surface Potential of 2D Materials
    The Surface Potential of 2D Materials
  • Microelectrode
    Microelectrode
  • 2D Material's Magnetic Domains
    2D Material's Magnetic Domains
  • Polymer Particle
    Polymer Particle
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
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