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face with a scanning range of 10 μm. The roughness of the C side is 0.72 nm.

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[AFM] SiC Surface
[AFM] SiC Surface
  • [AFM] Lanthanum-doped Lead Zirconate Titanate (PLZT)
    [AFM] Lanthanum-doped Lead Zirconate Titanate (PLZT)
  • [AFM] ETL Structure
    [AFM] ETL Structure
  • [AFM] OLED Pattern
    [AFM] OLED Pattern
  • [AFM] CMP Micro-Hole Array
    [AFM] CMP Micro-Hole Array
  • [AFM] Patterned Sapphire Substrate (PSS)
    [AFM] Patterned Sapphire Substrate (PSS)
  • [AFM] SiC Atomic Step
    [AFM] SiC Atomic Step
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