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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal
  • 2D-Materials
  • Thin Film

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  [AFM] Polymer Particle
• 
  [AFM] Microelectrode
• 
  [AFM] Standard Wafer
• 
  [AFM] The Surface Potential of SRAM
• 
  [AFM] SiC Surface
• 
  [AFM] CMP Micro-Hole Array
• 
  [AFM] SiC Atomic Step
• 
  [AFM] Surface Potential of Au-Al Material
• 
  [WLI] Flat Mirror
• 
  [WLI] Convex Lens
• 
  [WLI] 182 nm Standard Step Height
• 
  [WLI] Girds Matrix
• 
  [WLI] Polished Silicon Wafer

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[AFM] Surface Potential of Au-Al Material

This surface potential image of Au-Al material (scan size: 20 μm) displays the surface potentials of Au and Al in yellow and purple, respectively. Characterizing surface potentials of metallic and semiconductor materials provides critical insights for the material processing and manufacturing in the semiconductor and photovoltaic industries.

[AFM] Surface Potential of Au-Al Material

[AFM] LTPS Grains

[WLI] 182 nm Standard Step Height

[WLI] Girds Matrix

[WLI] Polished Silicon Wafer

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