AFM-Tuner
Wafer-Level Metrology Atomic Force Microscope

As a powerful tool for nanoscale characterization, AFM plays a key role in the semiconductor field, spanning fundamental research to industrial applications. It not only provides critical data support for semiconductor device design, manufacturing, and optimization but also offers irreplaceable advantages in driving the continued development of Moore's Law and the application of novel semiconductor materials (such as wide-bandgap semiconductors and 2D materials).

Low temperature polycrystalline silicon (LTPS) is a technology used to manufacture thin film transistors (TFT). It is widely applied in the modern display panel industry, particularly in high-end small-to-medium-sized display devices such as smartphones, tablet computers, automotive displays, premium laptops, and emerging flexible displays and AMOLED (Active-Matrix Organic Light-Emitting Diode) screens.

2D materials refer to novel nanomaterials with thicknesses of a single atom or a few atomic layers. Their most representative example is graphene, which also includes transition metal dichalcogenides (e.g., MoS₂), black phosphorus (BP), hexagonal boron nitride (h-BN), MXene, and 2D transition metal carbides/nitrides‌. These materials exhibit broad application prospects across multiple fields due to their unique physical, chemical, and electronic properties.

As one of the basic materials in modern technology, nanoscale thin films play a key role in multiple cutting-edge fields, such as electronics, energy, biology, and optics. Precise characterization and performance regulation of these films are crucial for achieving functionalization and high performance.