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ial (scan size: 20 μm) displays the surface potentials of Au and Al in yellow and purple, respectively. Characterizing surface potentials of metallic and semiconductor materials provides critical insights for the material processing and manufacturing in the semiconductor and photovoltaic industries.

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[AFM] Surface Potential of Au-Al Material
[AFM] Surface Potential of Au-Al Material
  • [AFM] LTPS Grains
    [AFM] LTPS Grains
  • [WLI] Flat Mirror
    [WLI] Flat Mirror
  • [WLI] Convex Lens
    [WLI] Convex Lens
  • [WLI] 182 nm Standard Step Height
    [WLI] 182 nm Standard Step Height
  • [WLI] Girds Matrix
    [WLI] Girds Matrix
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