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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

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  • Semiconductor
  • Display
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal
  • 2D-Materials
  • Thin Film

• 
  [AFM] SiC Atomic Step
• 
  [AFM] Patterned Sapphire Substrate (PSS)
• 
  [AFM] Halloysite Nanotubes
• 
  [AFM] LTPS Grain
• 
  [AFM] Aluminum Nitride Film
• 
  [AFM] Glass Substrate
• 
  [AFM] Polymer Particle
• 
  [AFM] LiNbO3 Ferroelectric Film
• 
  [AFM] Tape Magnetic Domains
• 
  [AFM] The Edge Structure of PSS
• 
  [AFM] Lanthanum-doped Lead Zirconate Titanate (PLZT)
• 
  [AFM] ETL Structure
• 
  [AFM] OLED Pattern
• 
  [AFM] Patterned Sapphire Substrate (PSS)
• 
  [AFM] Surface Potential of Au-Al Material
• 
  [AFM] LTPS Grains
• 
  [WLI] Flat Mirror
• 
  [WLI] Convex Lens
• 
  [WLI] Roughness Standard Sample
• 
  [WLI] Laser Marked Sample

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This surface potential image of Au-Al material (scan size: 20 μm) displays the surface potentials of Au and Al in yellow and purple, respectively. Characterizing surface potentials of metallic and semiconductor materials provides critical insights for the material processing and manufacturing in the semiconductor and photovoltaic industries.

[AFM] Surface Potential of Au-Al Material

[AFM] LTPS Grains

[WLI] Flat Mirror

[WLI] Convex Lens

[WLI] Roughness Standard Sample

[WLI] Laser Marked Sample

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