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nts the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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[WLI] Girds Matrix
[WLI] Girds Matrix
  • [WLI] Roughness Standard Sample
    [WLI] Roughness Standard Sample
  • [WLI] Polished Silicon Wafer
    [WLI] Polished Silicon Wafer
  • [WLI] Laser Marked Sample
    [WLI] Laser Marked Sample
  • [WLI] Lubricant Seal Cover
    [WLI] Lubricant Seal Cover
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