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System
- All
- AFM-Piccolo
- AFM-Baritone
- AFM-Tenor
- AFM-Tuba
- AFM-Tuner
- WLI-Marimba
- AFM-WLI Duet
Application
- All
- Semiconductor
- Display
- 2D Materials
- Thin films
- Polymer
- MEMS
- Metals
- Optical Element
- Metal

182 nm Standard Step Height
Girds Matrix
Roughness Standard Sample
Laser Marked Sample
Lubricant Seal Cover
Metal Groove
Metal Scratch

This is a surface topography image of a grid matrix structure with a scanning range of 0.1 mm×0.1 mm. The structure presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.