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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
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  • All
  • Semiconductor
  • Display
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  • MEMS
  • Metals
  • Optical Element
  • Metal
  • 2D-Materials
  • Thin Film

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  [AFM] Glass Substrate
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  [AFM] Polymer Particle
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  [AFM] Microelectrode
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  [AFM] LiNbO3 Ferroelectric Film
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  [AFM] Tape Magnetic Domains
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  [AFM] Standard Wafer
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  [AFM] The Surface Potential of SRAM
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  [AFM] SiC Surface
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  [AFM] Lanthanum-doped Lead Zirconate Titanate (PLZT)
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  [AFM] CMP Micro-Hole Array
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  [AFM] SiC Atomic Step
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  [AFM] Surface Potential of Au-Al Material
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  [AFM] LTPS Grains
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  [WLI] Flat Mirror
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  [WLI] Convex Lens
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  [WLI] 182 nm Standard Step Height
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  [WLI] Girds Matrix
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  [WLI] Roughness Standard Sample
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  [WLI] Polished Silicon Wafer
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  [WLI] Laser Marked Sample

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[WLI] Convex Lens

This is a surface topography image of a convex lens with a scanning range of 0.460 mm × 0.612 mm, which provides an important evaluation basis for evaluating optical imaging quality and optimizing lens manufacturing processes.

[WLI] Convex Lens

[WLI] 182 nm Standard Step Height

[WLI] Girds Matrix

[WLI] Roughness Standard Sample

[WLI] Polished Silicon Wafer

[WLI] Laser Marked Sample

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