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General Information
+86 21 65208265
+86 17721158621
info@frsinst.com
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Manager Li
+86 18994392037
likx@frsinst.com
Customer Service
support@frsinst.com

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- * Product models you are interested in：
  
  Applications in Square Grid Testing
  
  Applications in SRAM Testing
  
  Fast Measurement Software
  
  Automated Measurement Software
  
  The FreeSpirit Instruments x Phadcalc Atomic Force Microscope (AFM) Analysis Testing Center Landing in Chengdu, Combining High-End Instruments and Professional Services to Accurately Empower Scientific Research
  
  New Productivity in Hongkou | Exploring the Secrets of FreeSpirit Instruments: Creating a “Nanoscale Ruler” to Overcome Chip Manufacturing Measurement Problems
  
  From Lab to Market: The Breakthrough Path of Domestic AFMs – An Interview with Associate Professor Sen Wu, Co-founder and Chief Scientist of FreeSpirit Instruments, by Instrument.com.cn
  
  Real-Time Control Software
  
  Offline Analysis Software
  
  LTPS Grain
  
  The Surface Potential of Au-Al Material
  
  SiC Atomic Step
  
  Patterned Sapphire Substrate (PSS)
  
  CMP Micro-Holes Array
  
  OLED Pattern
  
  ETL Structure
  
  PLZT
  
  SiC Surface
  
  The Edge Structure of PSS
  
  The Surface Potential of SRAM
  
  Standard Wafer
  
  Tape Magnetic Domains
  
  LiNbO3 Ferroelectric Film
  
  The Surface Potential of 2D Materials
  
  Microelectrode
  
  2D Material's Magnetic Domains
  
  Polymer Particle
  
  Glass Substrate
  
  Atomic Force Microscope & White Light Interferometer in Situ Combination AFM-WLI Duet System，Providing Users with Convenient Cross-Scale Topography Characterization Solution
  
  The Square-Shaped Pattern of the PZT Material
  
  Innovative Measurement and Collaborating on the Future of Nanotechnology - FreeSpirit Instruments Invites You to Attend CHInano 2025 in Suzhou
  
  Technological Advances and Applications of FreeSpirit Domestic High-End Atomic Force Microscopes (AFMs)
  
  CIOE 2025 Concludes Successfully! FreeSpirit Instruments’ Domestic White Light Interferometer and Atomic Force Microscope Attract Attention
  
  Technological Advances and Applications of FreeSpirit Domestic High-End AFMs
  
  Product Overview of FreeSpirit AFM‑Tenor
  
  Product Overview of FreeSpirit AFM‑Baritone
  
  FreeSpirit Offline Analysis Software FreeAnalysis
  
  FreeSpirit Atomic Force Microscope Real-Time Control Software FreeControl
  
  FreeSpirit Multi functional Atomic Force Microscope Controller S-Controller
  
  Precise Characterization of Atomic Force Microscope (AFM) Enables Microscopic Observation of Silicon Carbide (SiC) Surface Interfaces
  
  The Key Role of Atomic Force Microscope (AFM) in LPTS Manufacturing and Quality Control
  
  Unveil the Powerful Applications of Atomic Force Microscope (AFM) in 2D Materials from the Surface Morphology to Surface Potential of h-BN
  
  Super Controller (S-Controller)
  
  Overview
  
  Sitemap
  
  Privacy Policy
  
  Contact Us
  
  Flat Mirror
  
  Convex Lens
  
  Product Brochure: AFM-WLI Duet
  
  182 nm Standard Step Height
  
  AFM-Baritone
  
  Girds Matrix
  
  AFM-Piccolo
  
  Product Brochure - AFM Tuba
  
  Roughness Standard Sample
  
  AFM-Tuba
  
  Operation Manual - AFM Piccolo
  
  Laser Marked Sample
  
  AFM-WLI Duet
  
  Product Brochure - WLI Marimba
  
  Lubricant Seal Cover
  
  WLI-Marimba
  
  Semiconductor
  
  Product Brochure - AFM Tenor
  
  Atomic Force Microscopy (AFM) as a Key Enabler for 2D Materials Research and Technological Innovation
  
  Metal Groove
  
  Display
  
  AFM-Tenor
  
  Product Brochure - AFM Baritone
  
  The Role of Atomic Force Microscopy (AFM) in LTPS Technology Research and Production Testing
  
  2D Materials
  
  AFM-Tuner
  
  Polished Silicon Wafer
  
  Product Brochure - AFM Piccolo
  
  Atomic Force Microscopy (AFM): A Key Enabler from Semiconductor Fundamental Research to Industrial Applications
  
  Metal Scratch
  
  AFM Probes
  
  Service Engineer
  
  Operation Manual - AFM Baritone
  
  The Essential Role of Atomic Force Microscopy (AFM) in Thin Film Research
  
  Thin Film
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