AFM-Baritone is a large-scale atomic force microscope designed for research and high-end industrial applications. It features a 200 mm fully automated sample stage, enabling topography and physical property analysis of various wafer sizes up to 8 inches and other sample types.

AFM-Piccolo is a desktop atomic force microscope specifically developed for research users. Equipped with an ultra-thin AFM head, it features fully open space above and in front of the probe, making it particularly suitable for in-situ integration with various high-resolution optical microscopy systems.