FreeSpirit Instruments × SEMICON JAPAN: Unlocking Innovative Applications of AFM in the Semiconductor Industry

SEMICON JAPAN 2025 is being grandly held in Tokyo, and FreeSpirit Instruments cordially invites you to visit booth S2608 ⛳, where you can meet technical experts on site to discuss cutting‑edge metrology technologies and explore innovative applications of atomic force microscopy (AFM) in advanced semiconductor processes.

At this exhibition, we will focus on showcasing two core solutions:

🔬 AFM-Baritone - 200 mm Stage Atomic Force Microscope

AFM-Baritone is a large-scale atomic force microscope designed for research and high-end industrial applications. It features a 200 mm fully automated sample stage, enabling topography and physical property analysis of various wafer sizes up to 8 inches and other sample types.

💡 AFM-Piccolo - Desktop Ultra-Thin Probe Atomic Force Microscope

AFM-Piccolo is a desktop atomic force microscope specifically developed for research users. Equipped with an ultra-thin AFM head, it features fully open space above and in front of the probe, making it particularly suitable for in-situ integration with various high-resolution optical microscopy systems.

FreeSpirit Instruments's atomic force microscopes excel in measuring wafer surface roughness, atomic steps, and surface structures, providing reliable metrology solutions for process improvement and quality control in advanced semiconductor manufacturing.

🌍 Exhibition website: https://www.semiconjapan.org/en
⏰ Exhibition dates: December 17–19, 2025
📍 Venue: Tokyo Big Sight
🚀 Booth number: S2608
🌍 Materials: Click our official website to download product manuals (http://en.frsinst.com/download/ ) or collect printed copies on site

We look forward to meeting you in Tokyo and jointly exploring the latest applications and development directions of atomic force microscopy (AFM) in the semiconductor industry.