AFM-Piccolo
Desktop Ultra-Thin Probe Atomic Force Microscope

Patented compact optical lever laser path with effective AFM head thickness<8 mm

Unobstructed space above and in front of the probe for upright and tilted objective lenses

Sample scanning method ensures that the relative positions of the probe and objective lenses remain unchanged

Setting multiple precision screws makes it convenient to align the cantilever laser and adjust the probe positions

This system combines both a white light interferometer head and an atomic force microscope head to perform in-situ cross-scale characterization of grid-patterned standard samples. This method yields both broad-range three-dimensional topography, localized contour and roughness measurements, and also enabling comparative analysis of height measurements at identical locations across the two distinct measurement methods.

AFM-Piccolo can be used in combination with Raman microscope in-situ. The AFM and Raman microscope in the combined system were respectively used to perform the topography imaging and spectral detection of silver nanowires on the surface of a gold film that had dispersed methyl violet molecules. This verified the Surface Enhanced Raman Scattering (SERS) effect under this experiment system and the correlation between the Raman signal intensity and the direction of the nanowires.