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WLI-Marimba

WLI-Marimba
Compact White Light Profiler

WLI-Marimba is a compact white light profiler specially designed for industrial and scientific users. It is widely applicable for measuring samples of various materials, enabling rapid acquisition and analysis of surface topography. At the same time, it offers customization capabilities, allowing it to meet specific measurement requirements in the most cost-effective manner while maintaining high standards.
Features
Traceability and Repeatability

The WLI-Marimba series adopts a 9.5 nm height standard step provided by VLSI for calibration, ensuring high measurement accuracy, low noise levels, and excellent repeatability.

Compact design, small space occupation, true desktop equipment

Lightweight design, the whole unit is only 20 kg for easy portability❶

100 μm vertical scanning range to meet most application requirements

Support modular options for excellent functional expansion, enabling optimal measurement configurations❷

❶Probe body weight under standard configuration conditions (excluding controller)

❷Support optional lenses, cameras, GPUs, and scanners

Specification
  • Measurement Unit
    Drive Mode
    Piezoelectric ceramic drive
    Motor drive (customizable)
    Scanning Range
    100 μm
    100 mm (customizable)
    Three-Axis Adjustment Method
    X-axis: Manual Y-axis: Manual Z-axis: Manual
    X-axis: Electronic control/manual Y-axis: Electronic control/manual Z-axis: Electronic control/manual
  • Computer
    Computer
    Latest processor (GPU accelerated, customizable)
    Display
    HD display
    Operating Software
    Software for FreeSpirit Instruments
    Objective Lens
    Michelson/Mirau interference objective lens (SX-SOX) (customizable)
    Camera
    High-speed CCD camera (customizable)
    Number of Pixels
    1920*1080/2160*1440 (customizable)
  • Imaging Unit
    Magnification
    Michelson type: 5X
    Mirau type: 10X 20X 30X
    Numerical Aperture
    Michelson type: 0.13
    Mirau type: 0.3 0.4 0.55
    Working Distance
    Michelson type: 9.3 mm
    Mirau type: 7.4 mm 4.7 mm 3.4 mm
    Lateral Resolution ❶
    Michelson type: 2.1 μ m
    Mirau type: 0.92 μ m 0.48 µ m 0.21 µ m
  • Measurement Technology
    White light interferometry
  • Roughness Analysis Function
    2D roughness analysis (Ra, Rq, Rz) 3D roughness analysis (Sa, Sq, Sz)
  • Result Presentation
    Provide supporting graphic visualization and data analysis software
  • Output
    Standard files containing measurement results and 3D data (customizable formats available)
  • Accuracy Calibration
    Calibrated by VLSI’s standard step height
  • Result Analysis Function
    Step height calculation, profile roughness analysis, frequency domain analysis, etc.
  • Dimensions and Weight
    Geometric Dimensions
    20 cm (W) x 24 cm (D) x 40 cm (H)
    Weight
    20 kg
    Voltage
    100-240±10% VAC
  • Performance (with 10X objective lens)
    ‌Longitudinal Scanning Range
    100 μm piezoelectric ceramic scanner
    100 mm stepper motor scanner
    Relative Error of Step Height Measurement ❷
    0.12% @ 1.762 µm ± 0.010 µm
    0.21% @ 181.0 nm ± 2.1 nm
    0.33% @ 45.5 nm ± 1.2 nm
    Step Height Measurement Repeatability ❸
    0.27% @ 1.762 µm ± 0.010 µm
    0.30% @ 181.0 nm ± 2.1 nm
    0.28% @ 45.5 nm ± 1.2 nm
    Surface Topography Repeatability ❹
    <0.180 nm
    RMS Repeatability ❺
    0.008 nm
    Measurement Uncertainty ❻
    0.63% @ 1.762 µm ± 0.010 µm
    1.19% @ 181.0 nm ± 2.1 nm
    2.65% @ 45.5 nm ± 1.2 nm
    Scanning Time ❼
    2s @ 1024*1024*1000
    6s @ 2048*2048*1000
    Scanning Speed ❽
    6 µm/s @ step=20 nm
    18 µm/s @step=60 nm
    Footnote
    Performance parameters are obtained under laboratory conditions using standard samples in accordance with ISO 25178-601, ISO 25178-604, and ISO 5436-1.
    ❶ Lateral resolution follows the Sparrow criterion and depends on the objective lens.
    ❷ Relative error between the measured step height and the standard value.
    ❸ 1δ of the step height from 10 repeated measurements.
    ❹ 0.5 cycles of interference fringes (all bright or all dark) appear in the field of view. The 1δ of the difference plane is measured twice consecutively on a smooth SiC surface with Ra=0.178 nm in the repeated area.
    ❺ Under the same measurement conditions as ❹, the 1δ of the surface Sq is measured 30 times consecutively on a smooth SiC surface with Ra = 0.178 nm.
    ❻ Measurement uncertainty of step height during piezoelectric scanning.
    ❼ Image size: 1024*1024 pixel or 2048*2048 pixel, with 1000 images captured. May vary with configurations.
    ❽ Camera exposure time: 1000 μs, frame rate: 300 fps, captured image size: 1920*1080 pixel, 8bit format. May vary with configurations.
Application
Software
Fast Measurement Software

Integrate measurement and analysis design, compatible with both piezoelectric ceramic and stepper motor scanners (optional), offering rich expandable functionality to meet the requirements for high-precision and rapid measurements.



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