AFM-Baritone
200 mm Stage Atomic Force Microscope
AFM Probes
FreeSpirit Instruments AFMs-AFM-Baritone, AFM-Tenor, AFM-Tuner, and AFM-Tuba-all use FreeSpirit Instruments-specific probes, while the AFM-Piccolo can be equipped with probes manufactured by third-party vendors.
AFM Probes of FreeSpirit Instruments
Probes used on FreeSpirit Instruments AFM (AFM-Baritone, AFM-Tenor, AFM-Tuner, AFM-Tuba) are pre-assembled versions. This means the cantilever must be pre-mounted to the iron plate to accommodate the APE (Automated Probe Exchange) function.
Currently, the following models are available for selection, as shown in the table below.
FreeSpirit Instruments AFM Probe List
Probe Type | Function | Resonance Frequency (f0) | Spring Constant (k) | Tip Radius (r) | Cantilever Shape | Conductive Coating |
APE-OLT-240AL | Topography | 70 kHz | 1.7 N/m | 7 nm | Rectangular | No |
APE-OLT-160AL | Topography | 270 kHz | 26 N/m | 7 nm | Rectangular | No |
APE-MMT-125AU | Electrical Testing | 120 kHz | 5 N/m | 30 nm | Rectangular | Yes |
Schematic diagram of pre installed probe box and corresponding labels
Schematic diagram of pre installed probe
Other AFM Probes
The FreeSpirit Instruments AFM-Piccolo uses a probe holder that directly clamps the probe cantilever. This allows direct use of probes manufactured by third-party vendors. Below are some principles for selecting probes; users may choose suitable probes based on their specific requirements.
Photos of AFM-Piccolo Probe Holder
Selecting the appropriate AFM probe requires consideration of multiple factors. Here we focus on testing in air, and the following outlines key principles for probe selection.
I. Selection Based on Imaging Mode
1. Contact Mode
Softer probes are generally recommended, typically with spring constants below 1 N/m.
If lateral force microscopy (LFM) testing is involved, a rectangular cantilever is recommended.
2. Tapping Mode
It is usually recommended to use harder probes with spring constants greater than 1 N/m and resonant frequencies greater than 50 kHz.
3. Mechanical Measurement (Force Curve)
Select probes with corresponding spring constants based on the estimated Young's modulus of the sample to ensure the probe can indent the sample without damaging it.
Sample Young's Modulus (E) | Probe Spring Constant (k) |
1 Mpa ~ 20 Mpa | 0.5 N/m |
5 Mpa ~ 500 Mpa | 5 N/m |
200 Mpa ~ 2 Gpa | 40 N/m |
1 Gpa ~ 20 Gpa | 200 N/m |
10 Gpa ~ 100 Gpa | 350 N/m |
4. Electrical Measurement (EFM/KPFM/PFM)
The probe tip and cantilever require a conductive coating, typically composed of Au or Pt/Ir.
5. Magnetic Measurement (MFM)
The probe tip and cantilever require a magnetic coating, typically composed of Co/Cr.
II. Selection Based on Required Resolution and Special Applications
1. Conventional Imaging
Standard silicon or silicon nitride cantilever probes are sufficient.
2. High-Resolution Imaging
Super sharp tips are required, typically with a tip radius less than 10 nm. The smaller the tip radius, the higher the lateral resolution of the image.
3. Special Structure Imaging
For deep trench samples, probes with the high aspect ratio are recommended.
For sidewall measurement, T-shaped probes with overhang are recommended.
4. Probe Modification
If modification with a microsphere is required, tipless probes are suitable.
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