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Atomic Force Microscope (AFM)
AFM-Baritone
AFM-Piccolo
AFM-Tuba
is an image of SiC atomic step with a scanning range of 500 nm, and the step height is approximately 0.75 nm. SiC, as a representative material of wide bandgap semiconductors, is regarded as an ideal material for manufacturing high-power semiconductor devices.">
SiC Atomic Step
Patterned Sapphire Substrate (PSS)
CMP Micro-Holes Array
OLED Pattern
ETL Structure
PLZT
SiC Surface
The Edge Structure of PSS
The Surface Potential of SRAM
Standard Wafer
Tape Magnetic Domains
LiNbO3 Ferroelectric Film
The Surface Potential of 2D Materials
Microelectrode
2D Material's Magnetic Domains
Polymer Particle
Glass Substrate
The Square-Shaped Pattern of the PZT Material
