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- Atomic Force Microscope (AFM)
  - AFM-Baritone
  - AFM-Piccolo
  - AFM-Tuba ge of SiC atomic step with a scanning range of 500 nm, and the step height is approximately 0.75 nm. SiC, as a representative material of wide bandgap semiconductors, is regarded as an ideal material for manufacturing high-power semiconductor devices.
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    SiC Atomic Step
  - Patterned Sapphire Substrate (PSS)
  - CMP Micro-Holes Array
  - OLED Pattern
  - ETL Structure
  - SiC Surface
  - The Edge Structure of PSS
  - The Surface Potential of SRAM
  - Standard Wafer
  - Microelectrode
  - Glass Substrate
  - 182 nm Standard Step Height
  - Girds Matrix
  - Roughness Standard Sample
  - Laser Marked Sample
  - Lubricant Seal Cover
  - Metal Groove
  - Polished Silicon Wafer
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