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    e presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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    Girds Matrix
    Girds Matrix
  • Polished Silicon Wafer
    Polished Silicon Wafer
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    048h-0.678 l-3.53-3.499l0.683-0.682l3.518,3.488L14.506,14.048z" /> info@frsinst.com

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