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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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mage can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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Standard Wafer
Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • Microelectrode
    Microelectrode
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • Flat Mirror
    Flat Mirror
  • Convex Lens
    Convex Lens
  • 182 nm Standard Step Height
    182 nm Standard Step Height
    • |<  v1.283c0,0.344-0.279,0.623-0.624,0.623H5.585c-0.344,0-0.624-0.279-0.624-0.623v-1.283 C4.961,22.678,5.241,22.398,5.585,22.398L5.585,22.398z" />
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
    EN
    中