FreeSpirit (Shanghai) Precision Instrument Co., Ltd
  • Home Home
  • Products Products
    • Atomic Force Microscope (AFM)
      • AFM-Baritone
      • AFM-Piccolo
      • AFM-Tuba
      • AFM-Tenor
      • AFM-Tuner
    • White Light Interferometry (WLI) 
      • WLI-Marimba
    • Integrated Systems
      • AFM-WLI Duet
    • Accessories
      • AFM Probes
  • Applications Applications
    • Semiconductor
    • Display
    • 2D Materials
    • Thin Film
  • Current Location:Home > Knowledge Center > Image Gallery
Filter by:
  • System
  • Application
  • System
  • Application
  • 182 nm Standard Step Height
    182 nm Standard Step Height
  • Girds Matrix
    Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Metal Scratch
    Metal Scratch
  • Products
    • Atomic Force Microscope (AFM)
    • White Light Interferometry (WLI) 
    • Integrated Systems
    • Accessories
  • Applications
    • Semiconductor
    • Display
    • 2D Materials
    • Thin Film
  • Knowledge Center
    • Image Gallery
    • Case Studies
    • Webinars
    • FreeSpirit Academy
    • Download Center
  • News & Events
    • News
    • Events
  • Company
    • Overview
    • Careers
    • Social Media
  • Contact
    • Contact Information
    • Online Enquiries
Social Media
  • Wechat Official Account
    Wechat Official Account
  • WeChat Channels
    WeChat Channels
  • Bilibili
  • RedNote

Copyright © 2025   FreeSpirit (Shanghai) Precision Instrument Co., Ltd   Shanghai ICP No. 2025145947-1   Privacy Policy  Sitemap

27-97.886 28.27-28.27 61.203-50.146 97.886-65.021 35.462-14.38 72.95-21.673 111.424-21.676l0.025-64h-0.032c-92.12 0.009-184.271 35.155-254.558 105.441-140.589 140.589-140.589 368.528 0 509.117 70.295 70.295 162.426 105.441 254.558 105.441 82.135 0 164.256-27.959 230.919-83.827l148.091 148.092c12.497 12.496 32.759 12.496 45.256 0 12.496-12.495 12.496-32.756 0-45.254z" fill="" p-id="1318">
EN
中
  • Home
  • Products
    • Atomic Force Microscope (AFM)
    • White Light Interferometry (WLI) 
    • Integrated Systems
    • Accessories
  • Applications
    • Semiconductor
    • Display
    • 2D Materials
    • Thin Film
  • Knowledge Center
    • Image Gallery
    • Case Studies
    • Webinars
    • FreeSpirit Academy
    • Download Center
  • News & Events
    • News
    • Events
  • Company
    • Overview
    • Careers
    • Social Media
  • Contact
    • Contact Information
    • Online Enquiries