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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
EN
中
ce topography image of a grid matrix structure with a scanning range of 0.1 mm×0.1 mm. The structure presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Polished Silicon Wafer
    Polished Silicon Wafer
  • Metal Scratch
    Metal Scratch

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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
    EN
    中
  • Microelectrode
    Microelectrode
  • Polymer Particle
    Polymer Particle
  • Glass Substrate
    Glass Substrate
  • Flat Mirror
    Flat Mirror
  • Convex Lens
    Convex Lens
  • 182 nm Standard Step Height
    182 nm Standard Step Height
  • Girds Matrix
    Girds Matrix
  • Polished Silicon Wafer
    Polished Silicon Wafer

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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
    EN
    中