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ography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Polished Silicon Wafer
    Polished Silicon Wafer
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    0.2-1.883-0.086 c-0.313,0.058-0.6-0.171-0.656-0.483c-0.057-0.314,0.172-0.6,0.484-0.656c0.799-0.114,1.568-0.086,2.34,0.113 c1.055,0.258,1.996,0.799,2.766,1.568c0.771,0.77,1.313,1.711,1.568,2.768c0.199,0.77,0.229,1.567,0.113,2.338 C15.847,7.191,15.618,7.42,15.333,7.42z" /> +86 21 65208265/+86 17721158621

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