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The Surface Potential of Au-Al Material -
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SiC Atomic Step -
CMP Micro-Holes Array -
SiC Surface -
The Surface Potential of SRAM - Standard Wafer
This is a surface topography image of a standard wafer with a scanning range of 20 μm. The image can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.
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Standard Wafer -
The Surface Potential of 2D Materials -
Microelectrode -
2D Material's Magnetic Domains -
Polymer Particle -
182 nm Standard Step Height -
Girds Matrix -
Polished Silicon Wafer
