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182 nm Standard Step Height

This is a standard step height topography image with a scanning range of 1.65 mm × 1.65 mm, with a nominal height of 181.0 nm ± 2.1 nm. It can be used to evaluate the accuracy and repeatability of the measurement systems, providing metrological traceabilductor" href="/applications/Semiconductor.html" >Semiconductor

182 nm Standard Step Height

Girds Matrix

Roughness Standard Sample

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