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Girds Matrix

This is a surface topography image of a grid matrix structure with a scanning range of 0.1 mm×0.1 mm. The structure presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Polished Silicon Wafer
    Polished Silicon Wafer

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