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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  CMP Micro-Holes Array
• 
  SiC Surface
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  Microelectrode
• 
  Polymer Particle
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample
• 
  Lubricant Seal Cover
• 
  Metal Groove
• 
  Polished Silicon Wafer
• 
  Metal Scratch

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The Square-Shaped Pattern of the PZT Material

182 nm Standard Step Height

Girds Matrix

Polished Silicon Wafer

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Room 2109, 21st Floor, Building 2, Ruihong Enterprise World, 118 Feihong Road, Hongkou District, Shanghai

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