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the accuracy and repeatability of the measurement systems, providing metrological traceability and a reference for measurement equipment.

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182 nm Standard Step Height
182 nm Standard Step Height
  • Girds Matrix
    Girds Matrix
  • Polished Silicon Wafer
    Polished Silicon Wafer
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    { autoplayFirstVideo: false, pager: false, galleryId: "nature", plugins: [lgZoom, lgThumbnail], mobileSettings: { // controls: false, // showCloseIcon: false, download: false, rotate: false } } ); });