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matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Polished Silicon Wafer
    Polished Silicon Wafer
  • |<   1 2    >| 

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    17 70.295 70.295 162.426 105.441 254.558 105.441 82.135 0 164.256-27.959 230.919-83.827l148.091 148.092c12.497 12.496 32.759 12.496 45.256 0 12.496-12.495 12.496-32.756 0-45.254z" fill="" p-id="1318">
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