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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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    • -28.27 61.203-50.146 97.886-65.021 35.462-14.38 72.95-21.673 111.424-21.676l0.025-64h-0.032c-92.12 0.009-184.271 35.155-254.558 105.441-140.589 140.589-140.589 368.528 0 509.117 70.295 70.295 162.426 105.441 254.558 105.441 82.135 0 164.256-27.959 230.919-83.827l148.091 148.092c12.497 12.496 32.759 12.496 45.256 0 12.496-12.495 12.496-32.756 0-45.254z" fill="" p-id="1318">
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    0/251030142I6453.jpg" data-sub-html="

    Standard Wafer

    This is a surface topography image of a standard wafer with a scanning range of 20 μm. The image can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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    Standard Wafer
    Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • The Surface Potential of 2D Materials
    The Surface Potential of 2D Materials
  • Microelectrode
    Microelectrode
  • 2D Material's Magnetic Domains
    2D Material's Magnetic Domains
  • Polymer Particle
    Polymer Particle
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
    • FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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