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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  Patterned Sapphire Substrate (PSS)
• 
  CMP Micro-Holes Array
• 
  OLED Pattern
• 
  ETL Structure
• 
  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  Microelectrode
• 
  Glass Substrate
• 
  Flat Mirror
• 
  Convex Lens
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Polished Silicon Wafer

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This is a metal groove topography image with a scanning range of approximately 0.119 mm × 0.136 mm. The depth of the groove is approximately 15 μm and the width is approximately 32 μm. It has important application value in the topography control of various industrial molds, providing data support for the function realization and process optimization of related components.

Metal Groove

Metal Scratch

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Convex Lens

182 nm Standard Step Height

Girds Matrix

Roughness Standard Sample

Laser Marked Sample

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