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LTPS Grain -
The Surface Potential of Au-Al Material -
Patterned Sapphire Substrate (PSS) -
OLED Pattern -
ETL Structure -
The Edge Structure of PSS -
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SiC Surface
This is a scanning image of the SiC surface with a scanning range of 10 μm. The roughness of the C side is 0.72 nm.
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SiC Surface -
The Edge Structure of PSS
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The Surface Potential of SRAM -
Standard Wafer -
The Surface Potential of 2D Materials -
Microelectrode -
2D Material's Magnetic Domains -
Glass Substrate -
Flat Mirror -
Convex Lens -
182 nm Standard Step Height -
Girds Matrix -
Roughness Standard Sample
