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  • AFM-Piccolo
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  • AFM-Tuba
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  • AFM-WLI Duet
• Application

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  • Semiconductor
  • Display
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  • Thin films
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  • Optical Element
  • Metal

• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  Patterned Sapphire Substrate (PSS)
• 
  OLED Pattern
• 
  ETL Structure
• 
  PLZT
• 
  The Edge Structure of PSS
• 
  Tape Magnetic Domains
• 
  LiNbO3 Ferroelectric Film
• 
  Polymer Particle
• 
  Glass Substrate
• 
  The Square-Shaped Pattern of the PZT Material
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample
• 
  Lubricant Seal Cover
• 
  Metal Groove
• 
  Metal Scratch

This is a standard step height topography image with a scanning range of 1.65 mm × 1.65 mm, with a nominal height of 181.0 nm ± 2.1 nm. It can be used to evaluate the accuracy and repeatability of the measurement systems, providing metrological traceability and a reference for measurement equipment.

182 nm Standard Step Height

Girds Matrix

Roughness Standard Sample

Laser Marked Sample

Lubricant Seal Cover

Metal Groove

Metal Scratch

Standard Wafer

Tape Magnetic Domains

LiNbO3 Ferroelectric Film

The Surface Potential of 2D Materials

Microelectrode

2D Material's Magnetic Domains

Glass Substrate

The Square-Shaped Pattern of the PZT Material

Flat Mirror