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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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SiC Surface
SiC Surface
  • The Edge Structure of PSS
    The Edge Structure of PSS
  • The Surface Potential of SRAM
    The Surface Potential of SRAM
     arset="utf-8"> mage can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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    Standard Wafer
    Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • Microelectrode
    Microelectrode
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • Flat Mirror
    Flat Mirror
  • Convex Lens
    Convex Lens
  • 182 nm Standard Step Height
    182 nm Standard Step Height
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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