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mage can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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Standard Wafer
Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • The Surface Potential of 2D Materials
    The Surface Potential of 2D Materials
  • Microelectrode
    Microelectrode
  • 2D Material's Magnetic Domains
    2D Material's Magnetic Domains
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • 182 nm Standard Step Height
    182 nm Standard Step Height
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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    Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Metal Scratch
    Metal Scratch
    • FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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