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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  Patterned Sapphire Substrate (PSS)
• 
  CMP Micro-Holes Array
• 
  OLED Pattern
• 
  ETL Structure
• 
  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  Microelectrode
• 
  Polymer Particle
• 
  Glass Substrate
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Polished Silicon Wafer

Roughness Standard Sample

This is a topography image of a roughness standard plate with a scanning range of 0.272 mm × 0.408 mm, with a nominal roughness value is 0.1 µm. It can be used to evaluate surface processing quality.

Roughness Standard Sample

Laser Marked Sample

Lubricant Seal Cover

Metal Groove

Metal Scratch