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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  Patterned Sapphire Substrate (PSS)
• 
  CMP Micro-Holes Array
• 
  OLED Pattern
• 
  ETL Structure
• 
  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  The Surface Potential of 2D Materials
• 
  Microelectrode
• 
  2D Material's Magnetic Domains
• 
  Polymer Particle
• 
  Glass Substrate
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample

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Flat Mirror

This is a surface topography image of a flat mirror with a scanning range of 0.890 mm × 1.208 mm, which can provide an analysis basis for the evaluation and improvement of mirror processing technology.

Flat Mirror

Convex Lens

182 nm Standard Step Height

Girds Matrix

Roughness Standard Sample

Laser Marked Sample

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