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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  Patterned Sapphire Substrate (PSS)
• 
  CMP Micro-Holes Array
• 
  OLED Pattern
• 
  ETL Structure
• 
  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  The Surface Potential of 2D Materials
• 
  Microelectrode
• 
  2D Material's Magnetic Domains
• 
  Glass Substrate
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample
• 
  Lubricant Seal Cover

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Polymer Particle

Glass Substrate

Flat Mirror

Convex Lens

182 nm Standard Step Height

Girds Matrix

Polished Silicon Wafer

Tape Magnetic Domains

LiNbO3 Ferroelectric Film

The Surface Potential of 2D Materials

Microelectrode

2D Material's Magnetic Domains

Polymer Particle

Glass Substrate

The Square-Shaped Pattern of the PZT Material

Roughness Standard Sample

This is a topography image of a roughness standard plate with a scanning range of 0.272 mm × 0.408 mm, with a nominal roughness value is 0.1 µm. It can be used to evaluate surface processing quality.

Roughness Standard Sample

Laser Marked Sample

Lubricant Seal Cover

Metal Groove

Metal Scratch