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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  SiC Atomic Step
• 
  Patterned Sapphire Substrate (PSS)
• 
  CMP Micro-Holes Array
• 
  OLED Pattern
• 
  ETL Structure
• 
  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
• 
  Microelectrode
• 
  Polymer Particle
• 
  Glass Substrate
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample
• 
  Lubricant Seal Cover
• 
  Metal Groove

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Standard Wafer

This is a surface topography image of a standard wafer with a scanning range of 20 μm. The image can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

Standard Wafer

Tape Magnetic Domains

LiNbO3 Ferroelectric Film

The Surface Potential of 2D Materials

Microelectrode

2D Material's Magnetic Domains

Polymer Particle

Glass Substrate

The Square-Shaped Pattern of the PZT Material

Tape Magnetic Domains

LiNbO3 Ferroelectric Film

Microelectrode

Glass Substrate

The Square-Shaped Pattern of the PZT Material

Flat Mirror

Convex Lens

182 nm Standard Step Height