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range of 0.1 mm×0.1 mm. The structure presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Metal Scratch
    Metal Scratch
  • r processing conforms to expectations, and provide a reference for identifying processing defects.

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    Standard Wafer
    Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • Microelectrode
    Microelectrode
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • 182 nm Standard Step Height
    182 nm Standard Step Height
  • Girds Matrix
    Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
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