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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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+86 21 65208265/+86 17721158621

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Room 2109, 21st Floor, Building 2, Ruihong Enterprise World, 118 Feihong Road, Hongkou District, Shanghai

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Copyright © 2025   FreeSpirit (Shanghai) Precision Instrument Co., Ltd   Shanghai ICP No. 2025145947-1   Privacy Policy  Sitemap

FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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/1999/xlink" x="0px" y="0px" width="16px" height="16px" fill="currentColor" viewBox="0 0 16 16" enable-background="new 0 0 16 16" xml:space="preserve"> +86 21 65208265/+86 17721158621

info@frsinst.com

Room 2109, 21st Floor, Building 2, Ruihong Enterprise World, 118 Feihong Road, Hongkou District, Shanghai

-->

Copyright © 2025   FreeSpirit (Shanghai) Precision Instrument Co., Ltd   Shanghai ICP No. 2025145947-1   Privacy Policy  Sitemap

FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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mage can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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Standard Wafer
Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • The Surface Potential of 2D Materials
    The Surface Potential of 2D Materials
  • Microelectrode
    Microelectrode
  • 2D Material's Magnetic Domains
    2D Material's Magnetic Domains
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • 182 nm Standard Step Height
    182 nm Standard Step Height
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
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