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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

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  LTPS Grain
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  The Surface Potential of Au-Al Material
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  SiC Atomic Step
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  Patterned Sapphire Substrate (PSS)
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  CMP Micro-Holes Array
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  OLED Pattern
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  ETL Structure
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  SiC Surface
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  The Edge Structure of PSS
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  The Surface Potential of SRAM
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  Standard Wafer
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  The Surface Potential of 2D Materials
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  Microelectrode
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  2D Material's Magnetic Domains
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  Glass Substrate
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  Flat Mirror
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  Convex Lens
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  182 nm Standard Step Height
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  Girds Matrix
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  Roughness Standard Sample

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Roughness Standard Sample

This is a topography image of a roughness standard plate with a scanning range of 0.272 mm × 0.408 mm, with a nominal roughness value is 0.1 µm. It can be used to evaluate surface processing quality.

Roughness Standard Sample

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