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mage can be used to determine whether the periodic structure of the wafer processing conforms to expectations, and provide a reference for identifying processing defects.

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Standard Wafer
Standard Wafer
  • Tape Magnetic Domains
    Tape Magnetic Domains
  • LiNbO3 Ferroelectric Film
    LiNbO3 Ferroelectric Film
  • Microelectrode
    Microelectrode
  • Polymer Particle
    Polymer Particle
  • Glass Substrate
    Glass Substrate
  • The Square-Shaped Pattern of the PZT Material
    The Square-Shaped Pattern of the PZT Material
  • 182 nm Standard Step Height
    182 nm Standard Step Height
  • Girds Matrix
    Girds Matrix
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