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• System

  • All
  • AFM-Piccolo
  • AFM-Baritone
  • AFM-Tenor
  • AFM-Tuba
  • AFM-Tuner
  • WLI-Marimba
  • AFM-WLI Duet
• Application

  • All
  • Semiconductor
  • Display
  • 2D Materials
  • Thin films
  • Polymer
  • MEMS
  • Metals
  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
• 
  Patterned Sapphire Substrate (PSS)
• 
  OLED Pattern
• 
  ETL Structure
• 
  PLZT
• 
  The Edge Structure of PSS
• 
  Tape Magnetic Domains
• 
  LiNbO3 Ferroelectric Film
• 
  The Surface Potential of 2D Materials
• 
  2D Material's Magnetic Domains
• 
  Polymer Particle
• 
  Glass Substrate
• 
  The Square-Shaped Pattern of the PZT Material
• 
  Flat Mirror
• 
  Convex Lens
• 
  182 nm Standard Step Height
• 
  Girds Matrix
• 
  Roughness Standard Sample
• 
  Laser Marked Sample

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This is a topography image of a roughness standard plate with a scanning range of 0.272 mm × 0.408 mm, with a nominal roughness value is 0.1 µm. It can be used to evaluate surface processing quality.

Roughness Standard Sample

Laser Marked Sample

Lubricant Seal Cover

Metal Groove

Polished Silicon Wafer

Metal Scratch

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The Surface Potential of 2D Materials

Microelectrode

2D Material's Magnetic Domains

Glass Substrate

The Square-Shaped Pattern of the PZT Material

Flat Mirror

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