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FreeSpirit (Shanghai) Precision Instrument Co., Ltd
EN
中
0.1 mm×0.1 mm. The structure presents the clear and regular periodic array topography, with a grid matrix unit depth of approximately 8.5 nm, which can be used for calibration of related instruments or process analysis.

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Girds Matrix
Girds Matrix
  • Roughness Standard Sample
    Roughness Standard Sample
  • Laser Marked Sample
    Laser Marked Sample
  • Lubricant Seal Cover
    Lubricant Seal Cover
  • Metal Groove
    Metal Groove
  • Polished Silicon Wafer
    Polished Silicon Wafer
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
    EN
    中
    164,0.065-0.32,0.179-0.436l6.005-6.085c0.243-0.246,0.638-0.249,0.884-0.007l0.007,0.007 l6.005,6.085c0.24,0.246,0.237,0.644-0.011,0.884c-0.114,0.113-0.271,0.178-0.437,0.178H17.439z M5.585,22.398h18.752 c0.345,0,0.624,0.279,0.624,0.623v1.283c0,0.344-0.279,0.623-0.624,0.623H5.585c-0.344,0-0.624-0.279-0.624-0.623v-1.283 C4.961,22.678,5.241,22.398,5.585,22.398L5.585,22.398z" />
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    FreeSpirit (Shanghai) Precision Instrument Co., Ltd
    EN
    中