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  • AFM-Piccolo
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  • WLI-Marimba
  • AFM-WLI Duet
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  • 2D Materials
  • Thin films
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  • Optical Element
  • Metal

• 
  LTPS Grain
• 
  The Surface Potential of Au-Al Material
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  SiC Atomic Step
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  Patterned Sapphire Substrate (PSS)
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  CMP Micro-Holes Array
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  OLED Pattern
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  ETL Structure
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  PLZT
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  SiC Surface
• 
  The Edge Structure of PSS
• 
  The Surface Potential of SRAM
• 
  Standard Wafer
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  Tape Magnetic Domains
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  LiNbO3 Ferroelectric Film
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  Microelectrode
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  Polymer Particle
• 
  Glass Substrate
• 
  The Square-Shaped Pattern of the PZT Material
• 
  Flat Mirror
• 
  Convex Lens

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This is a topography image of a laser marked sample with a scanning range of 0.548 mm × 0.685 mm. The laser drilling diameter is approximately 22 μm and its depth is approximately 15.2 μm. Obtaining the marking depth, groove topography and possible heat-affected zone bulging can be used to evaluate the marking quality and optimize laser process parameters.

Laser Marked Sample

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